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Equipment support

KORAM
Korea Institute for Rare Metals
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Equipment support

Probe Station

Probe Station Image

Equipment information
Field Analysis
Manufacturer MS-TECH
Model MST-8000C
Related Sites
Management personnel 서석준
Responsible for contacts 032-226-1358
Fee 50,000₩/Sample

◈ Purpose

• It's possible to measure the electrically and electronically characteristics of the circuits by contacting the Probe needle in detail by connecting the micro circuits with the electricity such as thin film materials, advanced materials, printed electronics, nano, LCD, LED, MEMS

 

◈ Specifications
• Leakage current : 10 fA level
• Temperature range : 30~ 500