◈ Function

  • It is a very high-resolution type of scanning probe microscopy, with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.

 

◈ Specifications

  • AFM stage / head / scanner

   - XY scan range: 50 μm × 50 μm ( Thickness : 20mm)

   - Z scan range: 15 μm

   - Sample weight: 500 g

   - Stage travel range: 20 mm × 20 mm

   - Stage resolution: 5 μm

   - Mechanical oscillation frequency: Up to 3 MHz 

  • Options

   - Contact AFM, Dynamic Contact AFM, True Non-contact AFM, LFM, Phase Imaging, 

      Force vs. Distance curve, Conductive AFM, I/V Spectroscopy, EFM DC-EFM, SKPM, PFM, MFM, 

      Heating Stage.